The arXiv preprint (abs/2605.18863, May 2026) introduces a dip-peak fitting function derived from convolving single-NV Lorentzian responses with distributed zero-field splitting and strain parameters. This replaces conventional Lorentzian or Voigt profiles that distort the central resonance region under weak microwave drive. Experiments on fluorescent nanodiamond ensembles demonstrated improved resonance-frequency extraction, yielding higher temperature sensitivity without increased optical or microwave power. As a preprint, the work lacks peer review and reports no explicit ensemble size or statistical power analysis, limiting claims of broad reproducibility. The approach connects to earlier NV thermometry demonstrations (e.g., Kucsko et al., Nature 2013 on nanoscale diamond thermometers and the 2021 review by Barry et al. in Nature Reviews Materials) by addressing a practical bottleneck in cw-ODMR linewidth determination that those studies noted but did not resolve analytically. Unlike single-NV scanning-probe work, ensemble implementations scale more readily to materials characterization and industrial metrology, yet the paper underplays integration challenges such as inhomogeneous broadening in bulk diamonds versus nanodiamonds. Overall, the method lowers the excitation threshold for precision sensing, potentially enabling battery-powered or remote quantum sensors in harsh environments where prior techniques required laboratory-grade microwave amplifiers.